Tillis, Leahy Introduce Bill to Curb Issuing of Flawed Patents

Aug. 2, 2022, 8:21 PM UTC

Sens. Thom Tillis (R-N.C.) and Patrick Leahy (D-Vt.) unveiled a bill that aims to raise the quality of patents by targeting the examination process.

The Patent Examination and Quality Improvement Act of 2022 would direct the Government Accountability Office to evaluate certain factors that may affect the quality of patents issued by the US Patent and Trademark Office. Recording examiner interviews, the assignment of patent applications to examiners, and a study of fraud in the application process would all be evaluated if the legislation is enacted, according to a Tillis press release.

Recommendations from the GAO, due one year after ...

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